Publication:

Impact of dopants and silicon structure dimensions on {113}- defect formation during 2 MeV electron irradiation in an UHVEM

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1830 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-15

Citations

Metrics

Views

1830 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-15

Citations