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Impact of dopants and silicon structure dimensions on {113}- defect formation during 2 MeV electron irradiation in an UHVEM
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Impact of dopants and silicon structure dimensions on {113}- defect formation during 2 MeV electron irradiation in an UHVEM
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Anada, S.
;
Nagase, T.
;
Yasuda, H.
;
Schulze, Andreas
;
Bender, Hugo
;
Rooyackers, Rita
;
Vandooren, Anne
Journal
Physica Status Solidi C
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1830
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Views
1830
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-15
Citations