Publication:
Open-circuit potential analysis as a fast screening method for the quality of high-k dielectric layers
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1810 since deposited on 2021-10-15
3last month
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Acq. date: 2026-10-13
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Statistics
Views
1810 since deposited on 2021-10-15
3last month
2last week
Acq. date: 2026-10-13
Citations