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Evaluation of plasma damage in patterned low-k structures by near-field scanning probe microwave microscope: effect of plasma ash chemistry
Publication:
Evaluation of plasma damage in patterned low-k structures by near-field scanning probe microwave microscope: effect of plasma ash chemistry
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Urbanowicz, Adam
;
Talanov, Vladimir
;
Pantouvaki, Marianna
;
Struyf, Herbert
;
De Gendt, Stefan
;
Baklanov, Mikhaïl
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1864
since deposited on 2021-10-18
1
last month
Acq. date: 2026-01-11
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Metrics
Views
1864
since deposited on 2021-10-18
1
last month
Acq. date: 2026-01-11
Citations