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Experimental investigation of optimum gate workfunction for CMOS four-terminal muligate MOSFETs (MUGFETs)
Publication:
Experimental investigation of optimum gate workfunction for CMOS four-terminal muligate MOSFETs (MUGFETs)
Date
2007
Journal article
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16258.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Masahara, Meishoku
;
Surdeanu, Radu
;
Witters, Liesbeth
;
Doornbos, Gerben
;
Nguyen Hoang, Viet
;
Van den Bosch, Geert
;
Vrancken, Christa
;
Jurczak, Gosia
;
Biesemans, Serge
Journal
IEEE Trans. Electron Devices
Abstract
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Views
1968
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1968
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations