Publication:

Experimental investigation of optimum gate workfunction for CMOS four-terminal muligate MOSFETs (MUGFETs)

Date

2007
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorMasahara, Meishoku
dc.contributor.authorSurdeanu, Radu
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorDoornbos, Gerben
dc.contributor.authorNguyen Hoang, Viet
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVrancken, Christa
dc.contributor.authorJurczak, Gosia
dc.contributor.authorBiesemans, Serge
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorDoornbos, Gerben
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVrancken, Christa
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.date.accessioned2021-10-16T17:53:46Z
dc.date.available2021-10-16T17:53:46Z
dc.date.embargo9999-12-31
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12565
dc.source.beginpage1431
dc.source.endpage1437
dc.source.issue6
dc.source.journalIEEE Trans. Electron Devices
dc.source.volume54
dc.title

Experimental investigation of optimum gate workfunction for CMOS four-terminal muligate MOSFETs (MUGFETs)

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
16258.pdf
Size:
1.19 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles