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Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
Publication:
Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
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Date
2021
Proceedings Paper
https://doi.org/10.1109/ITC50571.2021.00022
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Lizhou
;
Rao, Siddharth
;
Taouil, Mottaqiallah
;
Marinissen, Erik Jan
;
Kar, Gouri Sankar
;
Hamdioui, Said
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na
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1
since deposited on 2022-05-01
Acq. date: 2025-12-12
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1676
since deposited on 2022-05-01
Acq. date: 2025-12-12
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Downloads
1
since deposited on 2022-05-01
Acq. date: 2025-12-12
Views
1676
since deposited on 2022-05-01
Acq. date: 2025-12-12
Citations