Publication:

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions

Date

2021
Proceedings Paper
https://doi.org/10.1109/ITC50571.2021.00022
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dc.contributor.authorWu, Lizhou
dc.contributor.authorRao, Siddharth
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorHamdioui, Said
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2022-05-03T09:30:12Z
dc.date.available2022-05-01T02:12:04Z
dc.date.available2022-05-03T09:27:33Z
dc.date.available2022-05-03T09:30:12Z
dc.date.embargo9999-12-31
dc.date.issued2021
dc.identifier.doi10.1109/ITC50571.2021.00022
dc.identifier.eisbn978-1-6654-1695-5
dc.identifier.issn1089-3539
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39719
dc.publisherIEEE
dc.source.beginpage143
dc.source.conferenceIEEE International Test Conference (ITC)
dc.source.conferencedateOCT 10-15, 2021
dc.source.conferencelocationVirtual
dc.source.endpage152
dc.source.journalna
dc.source.numberofpages10
dc.subject.disciplineElectrical & electronic engineering
dc.subject.keywordsSTT-MRAM, MRAM, testing, embedded memory
dc.title

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions

dc.typeProceedings paper
dspace.entity.typePublication
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