Publication:
A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics
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1952 since deposited on 2021-10-21
1last month
Acq. date: 2026-01-11
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Metrics
Views
1952 since deposited on 2021-10-21
1last month
Acq. date: 2026-01-11
Citations