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Moore's Law meets High-NA EUV: Random via patterning for next-generation nodes
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Moore's Law meets High-NA EUV: Random via patterning for next-generation nodes
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Date
2025
Proceedings Paper
https://doi.org/10.1117/12.3050453
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chowrira Poovanna, Bhavishya
;
Blanco, Victor
;
Dusa, Mircea
;
Tan, Ling Ee
;
Vats, H.
;
Gillijns, Werner
;
Decoster, Stefan
;
Niroomand, Ardavan
;
Rutigliani, Vito
;
Halder, Sandip
;
Sangghaleh, Mahtab
;
Tyagi, Dhruv
;
Kamali, Ali
;
Newman, Marcus
;
Demand, M.
;
Wako, Y.
;
Negreira, A.
;
Clark, R.
;
Nafus, K.
;
O'Toole, M.
;
Hsia, J.
Journal
Proceedings of SPIE
Abstract
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Acq. date: 2026-01-26
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Views
45
since deposited on 2025-07-31
3
last month
3
last week
Acq. date: 2026-01-26
Citations