Publication:
Nanometer-scale roughness analysis of Si surfaces by TM-AFM for low-temperature epitaxy
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2206 since deposited on 2021-09-29
3last month
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Acq. date: 2026-07-17
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Statistics
Views
2206 since deposited on 2021-09-29
3last month
2last week
Acq. date: 2026-07-17
Citations