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Copper oxide direct bonding of 200mm CMOS wafers: morphological and electrical characterization
Publication:
Copper oxide direct bonding of 200mm CMOS wafers: morphological and electrical characterization
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Date
2015
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cavaco, Celso
;
Peng, Lan
;
De Leersnijder, Koen
;
Guerrieri, Stefano
;
Sabuncuoglu Tezcan, Deniz
;
Osman, Haris
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1956
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations
Metrics
Views
1956
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations