Publication:
Gated-diode study of corner and peripheral leakage current in high-energy neutron irradiated silicon p-n junctions
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2006 since deposited on 2021-10-15
3last month
2last week
Acq. date: 2026-01-06
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2006 since deposited on 2021-10-15
3last month
2last week
Acq. date: 2026-01-06
Citations