Publication:
Gated-diode study of corner and peripheral leakage current in high-energy neutron irradiated silicon p-n junctions
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2007 since deposited on 2021-10-15
4last month
1last week
Acq. date: 2026-01-12
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2007 since deposited on 2021-10-15
4last month
1last week
Acq. date: 2026-01-12
Citations