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Gated-diode study of corner and peripheral leakage current in high-energy neutron irradiated silicon p-n junctions
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2000 since deposited on 2021-10-15
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Acq. date: 2025-10-25
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Views
2000 since deposited on 2021-10-15
452item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations