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On the evolution of strain and electrical properties in as-grown and annealed Si:P epitaxial films for source-drain stressor applications
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On the evolution of strain and electrical properties in as-grown and annealed Si:P epitaxial films for source-drain stressor applications
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dhayalan, Sathish Kumar
;
Kujala, Jiri
;
Slotte, Jonatan
;
Pourtois, Geoffrey
;
Simoen, Eddy
;
Rosseel, Erik
;
Hikavyy, Andriy
;
Shimura, Yosuke
;
Loo, Roger
;
Vandervorst, Wilfried
Journal
ECS Journal of Solid State Science and Technology
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1959
since deposited on 2021-10-25
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Acq. date: 2026-08-07
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Statistics
Views
1959
since deposited on 2021-10-25
2
last month
Acq. date: 2026-08-07
Citations