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Influence of the strain-relaxation induced defect creation on the lekage current of embedded Si1-xGex source/drain junctions
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1969 since deposited on 2021-10-17
5last month
Acq. date: 2026-01-11
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Metrics
Views
1969 since deposited on 2021-10-17
5last month
Acq. date: 2026-01-11
Citations