Publication:

HfO2/spacer-interface breakdown in HfO2 high-k/poly-silicon gate stacks

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1995 since deposited on 2021-10-16
Acq. date: 2025-10-26

Citations

Metrics

Views

1995 since deposited on 2021-10-16
Acq. date: 2025-10-26

Citations