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Low frequency noise and fin width study of Si passivated Ge pFinFETs
Publication:
Low frequency noise and fin width study of Si passivated Ge pFinFETs
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vinicius de Oliveira, Alberto
;
Simoen, Eddy
;
Ghedini Der Agopian, Paula
;
Martino, Joao Antonio
;
Mitard, Jerome
;
Witters, Liesbeth
;
Langer, Robert
;
Collaert, Nadine
;
Claeys, Cor
;
Thean, Aaron
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1915
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations
Metrics
Views
1915
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations