Publication:
SILC defect generation spectroscopy in HfSiON using constant voltage stress and substrate hot electron injection
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1924 since deposited on 2021-10-17
2last month
Acq. date: 2026-07-18
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Views
1924 since deposited on 2021-10-17
2last month
Acq. date: 2026-07-18
Citations