Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

Michl, Jakob; Grill, Alexander; Waldhoer, Dominic; Goes, Wolfgang; Kaczer, Ben; Linten, Dimitri; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Grasser, Tibor; Waltl, Michael

doi:10.1109/TED.2021.3117740

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Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

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2021

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https://doi.org/10.1109/TED.2021.3117740

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IEEE TRANSACTIONS ON ELECTRON DEVICES

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1635 since deposited on 2021-12-16

Acq. date: 2026-03-17

Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

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