Publication:

Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

Date

2021
Journal article
https://doi.org/10.1109/TED.2021.3117740
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dc.contributor.authorMichl, Jakob
dc.contributor.authorGrill, Alexander
dc.contributor.authorWaldhoer, Dominic
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorParvais, Bertrand
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorRadu, Iuliana
dc.contributor.authorGrasser, Tibor
dc.contributor.authorWaltl, Michael
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecGovoreanu, Bogdan::0000-0001-7210-2979
dc.date.accessioned2022-08-31T10:35:22Z
dc.date.available2021-12-16T02:05:53Z
dc.date.available2022-05-30T09:26:44Z
dc.date.available2022-06-23T14:39:56Z
dc.date.available2022-06-24T11:40:23Z
dc.date.available2022-08-31T10:35:22Z
dc.date.embargo9999-12-31
dc.date.issued2021
dc.identifier.doi10.1109/TED.2021.3117740
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38620
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage6372
dc.source.endpage6378
dc.source.issue12
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages7
dc.source.volume68
dc.subject.keywordsTHRESHOLD VOLTAGE
dc.subject.keywordsDEFECTS
dc.title

Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

dc.typeJournal article
dspace.entity.typePublication
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