Publication:

Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors

Date

2023
Journal article
https://doi.org/10.1109/TNS.2023.3280432
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Author(s)

Guo, Zixiang
;
Li, Kan
;
Li, Xun
;
Luo, Xuyi
;
Zhang, En Xia
;
Reed, Robert A.
;
Schrimpf, Ronald D.
;
Fleetwood, Daniel M.
;
Vaisman Chasin, Adrian  
;
Mitard, Jerome  
;
Linten, Dimitri  

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

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922 since deposited on 2024-01-08
Acq. date: 2025-10-24

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922 since deposited on 2024-01-08
Acq. date: 2025-10-24

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