Publication:

Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors

Date

2023

Journal article

https://doi.org/10.1109/TNS.2023.3280432

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

Reed, Robert A.

;

Schrimpf, Ronald D.

;

Fleetwood, Daniel M.

;

Vaisman Chasin, Adrian

;

;

Linten, Dimitri

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Statistics

925 since deposited on 2024-01-08

1last month

Acq. date: 2026-01-25