Publication:

Electron-electron interaction signature peak in the substrate current versus gate voltage characteristics of N-channel silicon MOSFETS

Date

Loading...
Thumbnail Image

Journal

Abstract

Description

Metrics

Views

1846 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-08

Citations

Metrics

Views

1846 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-08

Citations