Publication:
Electron-electron interaction signature peak in the substrate current versus gate voltage characteristics of N-channel silicon MOSFETS
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1843 since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1843 since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations