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Investigation of aggressively scaled HfALOx-based interpoly dielectric stacks for sub-45nm nonvolatile memory technologies
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Investigation of aggressively scaled HfALOx-based interpoly dielectric stacks for sub-45nm nonvolatile memory technologies
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Date
2007
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Govoreanu, Bogdan
;
Wellekens, Dirk
;
Haspeslagh, Luc
;
Brunco, David
;
De Vos, Joeri
;
Ruiz Aguado, Daniel
;
Blomme, Pieter
;
van der Zanden, Koen
;
Van Houdt, Jan
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1919
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Acq. date: 2025-12-12
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1919
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-12
Citations