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Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction
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1871 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-06
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Statistics
Views
1871 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-06
Citations