Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Zero and one-dimensional electrical characterization of nanometer-wide Si fins
Publication:
Zero and one-dimensional electrical characterization of nanometer-wide Si fins
Date
2018
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Folkersma, Steven
;
Bogdanowicz, Janusz
;
Schulze, Andreas
;
Favia, Paola
;
Franquet, Alexis
;
Spampinato, Valentina
;
Petersen, Dirch
;
Hansen, Ole
;
Henrichsen, Henrik
;
Nielsen, Peter
;
Shiv, Lior
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
2081
since deposited on 2021-10-25
Acq. date: 2025-10-24
Citations
Metrics
Views
2081
since deposited on 2021-10-25
Acq. date: 2025-10-24
Citations