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Conference contributions
Electromigration, fuse and thermo-mechanical performance of solder bump versus Cu pillar flip chip assemblies
Publication:
Electromigration, fuse and thermo-mechanical performance of solder bump versus Cu pillar flip chip assemblies
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Date
2011
Proceedings Paper
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22175.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandevelde, Bart
;
Labie, Riet
;
Cherman, Vladimir
;
Webers, Tomas
;
Winters, Christophe
;
Beyne, Eric
;
Dosseul, Franck
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1890
since deposited on 2021-10-19
Acq. date: 2025-12-15
Citations
Metrics
Views
1890
since deposited on 2021-10-19
Acq. date: 2025-12-15
Citations