Publication:

Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors

Date

2022
Proceedings Paper
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Author(s)

Croes, Kristof  
;
Simons, Veerle  
;
Truijen, Brecht  
;
Roussel, Philippe  
;
Van Sever, Koen  
;
Tsiara, Artemisia  
;
Franco, Jacopo  
;
Absil, Philippe  

Journal

na

Abstract

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173 since deposited on 2022-08-05
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1294 since deposited on 2022-08-05
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Acq. date: 2026-05-18

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