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Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors
Publication:
Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors
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Date
2022
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Croes, Kristof
;
Simons, Veerle
;
Truijen, Brecht
;
Roussel, Philippe
;
Van Sever, Koen
;
Tsiara, Artemisia
;
Franco, Jacopo
;
Absil, Philippe
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na
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125
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Acq. date: 2025-12-15
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1289
since deposited on 2022-08-05
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Acq. date: 2025-12-15
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Metrics
Downloads
125
since deposited on 2022-08-05
9
last month
3
last week
Acq. date: 2025-12-15
Views
1289
since deposited on 2022-08-05
2
last month
Acq. date: 2025-12-15
Citations