Publication:

Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors

Date

2022
Proceedings Paper
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dc.contributor.authorCroes, Kristof
dc.contributor.authorSimons, Veerle
dc.contributor.authorTruijen, Brecht
dc.contributor.authorRoussel, Philippe
dc.contributor.authorVan Sever, Koen
dc.contributor.authorTsiara, Artemisia
dc.contributor.authorFranco, Jacopo
dc.contributor.authorAbsil, Philippe
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorSimons, Veerle
dc.contributor.imecauthorTruijen, Brecht
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorVan Sever, Koen
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecSimons, Veerle::0000-0001-5714-955X
dc.contributor.orcidimecTruijen, Brecht::0000-0002-2288-1414
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecTsiara, Artemisia::0000-0002-5612-6468
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.date.accessioned2023-04-28T07:32:21Z
dc.date.available2022-08-05T02:35:40Z
dc.date.available2023-04-28T07:32:21Z
dc.date.embargo2022-03-12
dc.date.issued2022
dc.identifier.eisbn978-1-55752-466-9
dc.identifier.issnna
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40205
dc.publisherIEEE
dc.source.conferenceOptical Fiber Communications Conference and Exhibition (OFC)
dc.source.conferencedateMAR 06-10, 2022
dc.source.conferencelocationSan Diego
dc.source.journalna
dc.source.numberofpages3
dc.title

Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors

dc.typeProceedings paper
dspace.entity.typePublication
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