Publication:

Dicing Lane Quality Quantification & Wafer Assessment Using Image Thresholding Techniques

Date

2024

Proceedings Paper

https://doi.org/10.1109/ESTC60143.2024.10712068

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Author(s)

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Tunca Altintas, Bensu

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Phommahaxay, Alain

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Journal

N/A

Statistics

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Acq. date: 2026-04-05