Publication:
Dicing Lane Quality Quantification & Wafer Assessment Using Image Thresholding Techniques
| dc.contributor.author | Leech, Damien | |
| dc.contributor.author | Hiro, Akito | |
| dc.contributor.author | Schoofs, Geert | |
| dc.contributor.author | Tunca Altintas, Bensu | |
| dc.contributor.author | Phommahaxay, Alain | |
| dc.contributor.author | Kennes, Koen | |
| dc.contributor.author | Beyer, Gerald | |
| dc.contributor.author | Beyne, Eric | |
| dc.contributor.imecauthor | Hiro, Akito | |
| dc.contributor.imecauthor | Schoofs, Geert | |
| dc.contributor.imecauthor | Phommahaxay, Alain | |
| dc.contributor.imecauthor | Kennes, Koen | |
| dc.contributor.imecauthor | Beyer, Gerald | |
| dc.contributor.imecauthor | Beyne, Eric | |
| dc.contributor.imecauthor | Leech, Damien | |
| dc.contributor.imecauthor | Tunca Altintas, Bensu | |
| dc.contributor.orcidimec | Hiro, Akito::0009-0007-2262-4921 | |
| dc.contributor.orcidimec | Phommahaxay, Alain::0000-0001-8672-2386 | |
| dc.contributor.orcidimec | Kennes, Koen::0000-0002-5987-2167 | |
| dc.contributor.orcidimec | Beyer, Gerald::0009-0001-0376-866X | |
| dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
| dc.contributor.orcidimec | Leech, Damien::0000-0002-7202-5392 | |
| dc.contributor.orcidimec | Tunca Altintas, Bensu::0000-0001-8611-3636 | |
| dc.date.accessioned | 2025-04-16T08:27:22Z | |
| dc.date.available | 2025-02-15T21:14:42Z | |
| dc.date.available | 2025-04-16T08:27:22Z | |
| dc.date.issued | 2024 | |
| dc.identifier.doi | 10.1109/ESTC60143.2024.10712068 | |
| dc.identifier.eisbn | 979-8-3503-9036-0 | |
| dc.identifier.isbn | 979-8-3503-9037-7 | |
| dc.identifier.issn | 2687-9700 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45220 | |
| dc.publisher | IEEE | |
| dc.source.conference | 10th IEEE Electronics System-Integration Technology Conference (ESTC) | |
| dc.source.conferencedate | SEP 11-13, 2024 | |
| dc.source.conferencelocation | Berlin | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 6 | |
| dc.subject.keywords | TECHNOLOGIES | |
| dc.title | Dicing Lane Quality Quantification & Wafer Assessment Using Image Thresholding Techniques | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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