Publication:
Investigation of the p-GaN gate breakdown in forward-biased GaN-based power HEMTs
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2030 since deposited on 2021-10-24
4last month
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Acq. date: 2026-01-06
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2030 since deposited on 2021-10-24
4last month
1last week
Acq. date: 2026-01-06
Citations