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Thermal conductivity of underlayers for EUV lithography and its effect on sensitivity of metal oxide resist
Publication:
Thermal conductivity of underlayers for EUV lithography and its effect on sensitivity of metal oxide resist
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Date
2025
Proceedings Paper
https://doi.org/10.1117/12.3051713
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fallica, Roberto
;
De Simone, Danilo
;
Hopkins, Patrick E.
;
Jones, Andrew
;
Gaskinsc, John
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38
since deposited on 2025-07-31
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Acq. date: 2026-01-07
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Views
38
since deposited on 2025-07-31
3
last month
Acq. date: 2026-01-07
Citations