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Conference contributions
Processing dependences of CHC degradation on strained-Si pMOSFETs
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Processing dependences of CHC degradation on strained-Si pMOSFETs
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Date
2010
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Amat, Esteve
;
Martin Martinez, Javier
;
Bargallo Gonzalez, Mireia
;
Rodriguez, Rosana
;
Nafria, Montse
;
Simoen, Eddy
;
Verheyen, Peter
;
Aymerich, Xavier
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1957
since deposited on 2021-10-18
Acq. date: 2025-12-09
Citations
Metrics
Views
1957
since deposited on 2021-10-18
Acq. date: 2025-12-09
Citations