Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Point defect reactions in silicon studied in situ by high flux electron irradiation in high voltage transmission electron microscope
Publication:
Point defect reactions in silicon studied in situ by high flux electron irradiation in high voltage transmission electron microscope
Copy permalink
Date
1995
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
953.pdf
1 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Romano, Albert
;
Fedina, L.
;
Van Landuyt, J.
;
Aseev, A.
Journal
Materials Science and Technology
Abstract
Description
Metrics
Views
1947
since deposited on 2021-09-29
Acq. date: 2026-01-07
Citations
Metrics
Views
1947
since deposited on 2021-09-29
Acq. date: 2026-01-07
Citations