Parametric and functional degradation analysis of complete 14-nm FinFET SRAM

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44704.pdf 2.49 MB

Author(s)

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Cosemans, Stefan

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Catthoor, Francky

Journal

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Metrics

1889 since deposited on 2021-10-27

Acq. date: 2025-10-28