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Parametric and functional degradation analysis of complete 14-nm FinFET SRAM

Date

2019
Journal article
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dc.contributor.authorKraak, Daniel
dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorCatthoor, Francky
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-27T11:45:29Z
dc.date.available2021-10-27T11:45:29Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.issn1063-8210
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33329
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8678671
dc.source.beginpage1308
dc.source.endpage1321
dc.source.issue6
dc.source.journalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
dc.source.volume27
dc.title

Parametric and functional degradation analysis of complete 14-nm FinFET SRAM

dc.typeJournal article
dspace.entity.typePublication
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