Publication:
Lateral and vertical scaling impact on statistical performances and reliability of 10nm TiN/Hf(Al)O/Hf/TiN RRAM devices
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1829 since deposited on 2021-10-22
2last month
Acq. date: 2026-02-24
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Statistics
Views
1829 since deposited on 2021-10-22
2last month
Acq. date: 2026-02-24
Citations