Publication:
Lateral and vertical scaling impact on statistical performances and reliability of 10nm TiN/Hf(Al)O/Hf/TiN RRAM devices
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1824 since deposited on 2021-10-22
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Acq. date: 2025-12-15
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1824 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2025-12-15
Citations