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Reducing optical losses in focused-ion-beam etched silicon
Publication:
Reducing optical losses in focused-ion-beam etched silicon
Date
2008
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17203.pdf
729.96 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schrauwen, Jonathan
;
Van Thourhout, Dries
;
Baets, Roel
;
Klein, E.
;
Ay, F.
;
Hopman, W.
;
De Ridder, R.
Journal
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1898
since deposited on 2021-10-17
Acq. date: 2025-10-25
Citations
Metrics
Views
1898
since deposited on 2021-10-17
Acq. date: 2025-10-25
Citations