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Impact of gate stack dielectric on intrinsic voltage gain and low frequency noise in Ge pMOSFETs
Publication:
Impact of gate stack dielectric on intrinsic voltage gain and low frequency noise in Ge pMOSFETs
Date
2015
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Oliveira, A.V.
;
Agopian, P.G.D.
;
Martino, J.A.
;
Fang, Wen
;
Arimura, Hiroaki
;
Mitard, Jerome
;
Mertens, Hans
;
Simoen, Eddy
;
Mocuta, Anda
;
Collaert, Nadine
;
Thean, Aaron
;
Claeys, Cor
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Metrics
Views
1898
since deposited on 2021-10-22
416
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations