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Conference contributions
Electromigration scaling limits of copper interconnects
Publication:
Electromigration scaling limits of copper interconnects
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Date
2019
Proceedings Paper
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43335.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Varela Pedreira, Olalla
;
Zahedmanesh, Houman
;
Ciofi, Ivan
;
Tokei, Zsolt
;
Croes, Kristof
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Downloads
3
since deposited on 2021-10-27
Acq. date: 2025-12-16
Views
1883
since deposited on 2021-10-27
2
last month
Acq. date: 2025-12-16
Citations