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Advances in SiCN-SiCN bonding with high accuracy wafer-to-wafer (W2W) stacking technology
Publication:
Advances in SiCN-SiCN bonding with high accuracy wafer-to-wafer (W2W) stacking technology
Date
2018
Proceedings Paper
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38153.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Peng, Lan
;
Kim, Soon-Wook
;
Iacovo, Serena
;
Inoue, Fumihiro
;
Phommahaxay, Alain
;
Sleeckx, Erik
;
De Vos, Joeri
;
Zinner, Dominik
;
Wagenleitner, Thomas
;
Uhrmann, Thomas
;
Wimplinger, Markus
;
Schoenaers, Ben
;
Stesmans, Andre
;
Afanasiev, Valeri
;
Miller, Andy
;
Beyer, Gerald
;
Beyne, Eric
Journal
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2079
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Acq. date: 2025-10-24
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Metrics
Views
2079
since deposited on 2021-10-26
468
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations