Publication:
Advances in SiCN-SiCN bonding with high accuracy wafer-to-wafer (W2W) stacking technology
Date
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| dc.contributor.author | Peng, Lan | |
| dc.contributor.author | Kim, Soon-Wook | |
| dc.contributor.author | Iacovo, Serena | |
| dc.contributor.author | Inoue, Fumihiro | |
| dc.contributor.author | Phommahaxay, Alain | |
| dc.contributor.author | Sleeckx, Erik | |
| dc.contributor.author | De Vos, Joeri | |
| dc.contributor.author | Zinner, Dominik | |
| dc.contributor.author | Wagenleitner, Thomas | |
| dc.contributor.author | Uhrmann, Thomas | |
| dc.contributor.author | Wimplinger, Markus | |
| dc.contributor.author | Schoenaers, Ben | |
| dc.contributor.author | Stesmans, Andre | |
| dc.contributor.author | Afanasiev, Valeri | |
| dc.contributor.author | Miller, Andy | |
| dc.contributor.author | Beyer, Gerald | |
| dc.contributor.author | Beyne, Eric | |
| dc.contributor.imecauthor | Peng, Lan | |
| dc.contributor.imecauthor | Kim, Soon-Wook | |
| dc.contributor.imecauthor | Iacovo, Serena | |
| dc.contributor.imecauthor | Inoue, Fumihiro | |
| dc.contributor.imecauthor | Phommahaxay, Alain | |
| dc.contributor.imecauthor | Sleeckx, Erik | |
| dc.contributor.imecauthor | De Vos, Joeri | |
| dc.contributor.imecauthor | Afanasiev, Valeri | |
| dc.contributor.imecauthor | Miller, Andy | |
| dc.contributor.imecauthor | Beyer, Gerald | |
| dc.contributor.imecauthor | Beyne, Eric | |
| dc.contributor.orcidimec | Peng, Lan::0000-0003-1824-126X | |
| dc.contributor.orcidimec | Iacovo, Serena::0000-0002-0826-9165 | |
| dc.contributor.orcidimec | Sleeckx, Erik::0000-0003-2560-6132 | |
| dc.contributor.orcidimec | De Vos, Joeri::0000-0002-9332-9336 | |
| dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
| dc.date.accessioned | 2021-10-26T00:59:17Z | |
| dc.date.available | 2021-10-26T00:59:17Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2018 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31505 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8429664 | |
| dc.source.beginpage | 985 | |
| dc.source.conference | IEEE International Interconnect Technology Conference - IITC | |
| dc.source.conferencedate | 4/06/2018 | |
| dc.source.conferencelocation | Santa Clara, CA USA | |
| dc.source.endpage | 992 | |
| dc.title | Advances in SiCN-SiCN bonding with high accuracy wafer-to-wafer (W2W) stacking technology | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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