Publication:
Comparison of sub 1 nm TiN/HfO2 with Poly-Si/HfO2 gate stacks u sing scaled chemical oxide interfaces
Date
Loading...
Journal
Abstract
Description
Statistics
Views
2051 since deposited on 2021-10-15
2last month
1last week
Acq. date: 2026-01-25
Citations
Statistics
Views
2051 since deposited on 2021-10-15
2last month
1last week
Acq. date: 2026-01-25
Citations