Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Internal photoemission at interfaces of ALD TaiOx insulating layers deposited on Si, InP and In0.53Ga0.47As
Publication:
Internal photoemission at interfaces of ALD TaiOx insulating layers deposited on Si, InP and In0.53Ga0.47As
Date
2012
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
24886.pdf
984.28 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chou, H.-Y.
;
Afanasiev, Valeri
;
Thoan, N.H.
;
Adelmann, Christoph
;
Lin, Dennis
;
Houssa, Michel
;
Stesmans, Andre
Journal
Abstract
Description
Metrics
Views
1917
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1917
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations