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Articles
Wafer bevel protection during deep reactive ion etching
Publication:
Wafer bevel protection during deep reactive ion etching
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Date
2011
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Charavel, Remy
;
Roig, Jaime
;
Altamirano Sanchez, Efrain
;
Van Aelst, Joke
;
Devriendt, Katia
;
Van Wichelen, Koen
;
Gassot, Pierre
;
Coppens, Peter
;
De Backer, Eddy
Journal
IEEE Transactions on Semiconductor Manufacturing
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2137
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Acq. date: 2025-12-10
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Metrics
Views
2137
since deposited on 2021-10-19
1
last month
1
last week
Acq. date: 2025-12-10
Citations