Publication:
Temperature impact on the Lorentzian noise induced by electron valence-band tunneling in partially depleted SOI p-MOSFETs
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1916 since deposited on 2021-10-16
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Acq. date: 2026-08-07
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1916 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-08-07
Citations