Publication:
Temperature impact on the Lorentzian noise induced by electron valence-band tunneling in partially depleted SOI p-MOSFETs
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1915 since deposited on 2021-10-16
4last month
Acq. date: 2025-12-09
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Views
1915 since deposited on 2021-10-16
4last month
Acq. date: 2025-12-09
Citations