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Precise optical constants: determination and impact on metrology, simulation and development of EUV masks
Publication:
Precise optical constants: determination and impact on metrology, simulation and development of EUV masks
Date
2022
Proceedings Paper
https://doi.org/10.1117/12.2643246
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Saadeh, Qais
;
Mesilhy, Hazem
;
Soltwisch, Victor
;
Erdmann, Andreas
;
Ciesielski, Richard
;
Lohr, Leonhard
;
Andrle, Anna
;
Philipsen, Vicky
;
Thakare, Devesh
;
Laubis, Christian
;
Scholze, Frank
;
Kolbe, Michael
Journal
Proceedings of SPIE
Abstract
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1253
since deposited on 2023-02-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1253
since deposited on 2023-02-15
Acq. date: 2025-10-23
Citations