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High volume manufacturing compatible dry development rinse process (DDRP): patterning and defectivity performance for EUVL
Publication:
High volume manufacturing compatible dry development rinse process (DDRP): patterning and defectivity performance for EUVL
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Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sayan, Safak
;
Vanelderen, Pieter
;
Hetel, Iulian
;
Chan, BT
;
Raghavan, Praveen
;
Blanco, Victor
;
Foubert, Philippe
;
D'Urzo, Lucia
;
De Simone, Danilo
;
Vandenberghe, Geert
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1970
since deposited on 2021-10-24
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last month
Acq. date: 2025-12-11
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Metrics
Views
1970
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-11
Citations