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Low temperature backside damascene processing on temporary carrier wafer targeting 7 mu m and 5 mu m pitch microbumps for N equal and greater than 2 die to wafer TCB stacking
Publication:
Low temperature backside damascene processing on temporary carrier wafer targeting 7 mu m and 5 mu m pitch microbumps for N equal and greater than 2 die to wafer TCB stacking
Date
2022
Proceedings Paper
https://doi.org/10.1109/ECTC51906.2022.00179
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Derakhshandeh, Jaber
;
Beyne, Eric
;
Beyer, Gerald
;
Capuz, Giovanni
;
Cherman, Vladimir
;
De Preter, Inge
;
Gerets, Carine
;
Shafahian, Ehsan
;
Kennes, Koen
;
Jamieson, Geraldine
;
Cochet, Tom
;
Webers, Tomas
;
Tobback, Bert
;
Van der Plas, Geert
;
La Tulipe, Douglas Charles
;
Phommahaxay, Alain
;
Miller, Andy
Journal
na
Abstract
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1382
since deposited on 2022-09-17
Acq. date: 2025-10-27
Citations
Metrics
Views
1382
since deposited on 2022-09-17
Acq. date: 2025-10-27
Citations