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Design And Sign-off Methodologies For Wafer-To-Wafer Bonded 3D-ICs At Advanced Nodes (invited)
Publication:
Design And Sign-off Methodologies For Wafer-To-Wafer Bonded 3D-ICs At Advanced Nodes (invited)
Date
2021-11-04
Proceedings Paper
https://doi.org/10.1109/SLIP52707.2021.00011
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sisto, Giuliano
;
Chen, Rongmei
;
Chou, Richard
;
Van der Plas, Geert
;
Beyne, Eric
;
Rod Metcalfe
;
Milojevic, Dragomir
Journal
na
Abstract
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1680
since deposited on 2022-03-26
Acq. date: 2025-10-25
Citations
Metrics
Views
1680
since deposited on 2022-03-26
Acq. date: 2025-10-25
Citations