Publication:

Impact of dimensions of memory periphery FinFETs on bias temperature instability

Date

2020

Journal article

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Author(s)

;

O'Sullivan, Barry

;

;

;

Dentoni Litta, Eugenio

;

Ritzenthaler, Romain

;

Dupuy, Emmanuel

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Machkaoutsan, Vladimir

;

;

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Benaceur-Doumaz, D.

;

Ferhat Hamida, A.

;

Spessot, Alessio

;

Linten, Dimitri

;

Horiguchi, Naoto

Journal

IEEE Transactions on Device and Materials Reliability

Statistics

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Acq. date: 2026-04-26