Publication:

Impact of dimensions of memory periphery FinFETs on bias temperature instability

Date

2020

Journal article

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Author(s)

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O'Sullivan, Barry

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;

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Dentoni Litta, Eugenio

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Ritzenthaler, Romain

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Dupuy, Emmanuel

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Machkaoutsan, Vladimir

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Benaceur-Doumaz, D.

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Ferhat Hamida, A.

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Spessot, Alessio

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Linten, Dimitri

;

Horiguchi, Naoto

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

1924 since deposited on 2021-10-28

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Acq. date: 2025-12-15